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Physical Electronics, Inc. - http://www.phi.com/
Surface analysis instrumentation, including: AES, ESCA, TOF-SIMS and D-SIMS based instrumentation. |
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Area Detector Systems Corporation - http://www.adsc-xray.com/
Manufacturer of CCD detectors, particularly in the x-ray range. Includes specifications, certification and technical support from Poway, California. |
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LumaSense Technologies AS - http://www.lumasenseinc.com/
Manufacturing systems for measurements in anaesthetic gas monitoring, fermentation monitoring, tracer gas, photoacoustic, ventilation and thermal comfort. Includes applications, publications, contacts in Europe and headquarters in Santa Clara, California |
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Oxford Microbeams Ltd. - http://www.microbeams.co.uk/
Non-destructive, trace elemental analysis, ion beam analysis using a focused microbeam. Includes applications in tomography and microfabrication, downloads and contacts in England. |
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Axic, Inc. - http://www.axic.com/
Manufactures and distributes semiconductor plasma processing equipment and thin film metrology tools for the semiconductor, III-V compound semiconductor, optics, photonics, optoelectronics, nanotechnology and micro electromechanical system (MEMS) industries. Includes product overview, contacts for technical support, worldwide distribution and location map of Santa Clara, California. |